STMicroelectronics chooses Imina Technologies’ Probers for Failure Analysis Investigations

Please login or
register
31.05.2016

STMicroelectronics, Europe's largest semiconductor chip maker, has selected Imina Technologies' probers. In addition, Imina Technologies announces the successful installation of the new load-lock compatible Nanoprobing SEM Solution in a scanning electron microscope at the University of Rennes 1 in France.

Founded in 2009, Imina Technologies designs, manufactures and distributes complete lines of robotics solutions for electron and light microscopes. Based on a novel mobile motion technology, their robots for microscopes combine nanometer resolution of positioning, unprecedented ease-of-use and flexibility. Their ultra-compact design provides high stability ensuring steady pose over long measurement sequence, while preventing sample damages.

One of the company’s major achievements was the recent installation of the new load-lock Nanoprobing SEM Solution at the University of Rennes 1 in France. This will be used for microelectronics investigations. Professor Jean-Pierre Landesman, the director of the Physics Institute at the University of Rennes, is exhilarated by the potential provided by the combined use of the miBot nanoprobers and the SEM. He stated that "several parameters have made the installation of nanomanipulators in our SEM very challenging; because the microscope is being shared between several teams at the university and by external partners including private companies. It is thus crucial to ensure full airlock compatibility of the manipulators and at the same time, to guarantee an identical microscope operation when they are not used. Moreover, we looked for nanomanipulators versatile enough to handle and characterize multiple types of samples. We found in Imina Technologies' solution the perfect compromise between the compactness of the Nanoprobing platform and the flexibility of use of the miBots."

New Load-lock Nanoprobing SEM Solution

The load-lock compatible Nanoprobing SEM Solution is another step towards simplification and acceleration of electrical measurements at nanoscale: "It brings the unique performances of the miBot technology to semiconductor failure analysis teams that will save time and gather results with higher throughput by avoiding breakage of the vacuum between experiments." declared Dr. Benoît Dagon, CEO of Imina Technologies SA.

The system will be presented on June 7, 2016 at the SCANDEM conference in Trondheim, Norway. On June 1, 2016, an introduction on Imina Technologies nanoprobing solutions will also be given at the webinar “Nanoscale Manipulation and Probing in the SEM”. Registration to the webinar is free.

STMicroelectronics Chooses Imina Technologies
The semiconductor manufacturer STMicroelectronics has chosen Imina Technologies' probers to expand their failure analysis investigation capabilities. In the past three years, to respond to the growing interest of the semiconductor industry in Imina’s probing systems, the company has focused developments on continuously improving the Nanoprobing and Compact product lines to tackle today's challenges in FA labs; namely, to have micro-/nano-probers that adapt to various sample architectures and sizes, that are operated by numerous users with limited training time, and that are compatible with multiple optical inspection equipment. With their compact design, stability, positioning precision, and ease-of-use, the miBot robots are ideal to address these needs.

(RAN)

0Comments

More news about

Imina Technologies SA

Company profiles on startup.ch

Imina Technologies SA

rss